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Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
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Fused silica substrates, 25 mm dia, 3 mm thick
7440-21-3
Silicon wafer (single side polished), <111>, N-type, contains phosphorus as dopant, diam. x thickness 2 in. x 0.275 mm
Bi-Telecentric Lens (C-Mount) for 2/3” detector, magnification 1.0
ZnSe Optical Windows, (42 mm Dia. x 2 mm Thick)
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.