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Surface Flatness : λ/10Reflectivity : 70 % ± 1.0 % at 45° angle of incidence
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Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
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Indium phosphide substrates, <100>, semi insulating, contains iron as dopant, diam. × thickness 50.5 mm × 350 μm
Quartz substrates thick 0.5 mm, size 10 mm × 10 mm
Fused silica substrates, 25 mm dia, 3 mm thick
Plano Convex Lens, Dia 25 mm, Focal Length 25 mm
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.