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Common substrate for III-V nitrides as well as many other epitaxial films.
WGK Germany nwg
Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
For any quries, please write to us at
1306-24-7
Cadmium selenide, 99.999%
409-21-2
Silicon carbide (4H-SiC) wafers, dia 100 mm, thick 1.0 mm
Poly(methyl)methacrylate Microparticles [Mean Diameter (µm) 0.520]
Poly(methyl)methacrylate Microparticles [Mean Diameter (µm) 0.196]
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.