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QSS 069 (OTTO) Quartz substrate, thickness 1.0 mm, size 10 × 10 mm - applications in semiconductor and optical device fabrication.
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Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
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SI wafers, P-type, dia 4 inch, thick 0.525 mm [Thermal oxide wafer 300 nm SiO2 layer on Si (100)]
7440-21-3
Silicon wafer (single side polished), <100>, N (Phosphorous doped), diam. x thickness 76 mm x 380 μm
Potassium Bromide Window (50mm Dia. x 3mm Thick)
Calcium Fluoride Window, (42 mm Dia. x 2 mm Thick)
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.