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Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
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7440-21-3
Silicon substrate (single side polished), <100>, P-type, diam. × thickness 1 in. × 300 - 400 μm
Silicon wafer (single side polished), <111>, P-type, contains boron as dopant, diam. x thickness 2 in. x 0.5 mm
Silicon wafer (single side polished), <100>, N-type, diam. x thickness 4 in x 0.525 mm
Plano Convex Spherical Lens, Focal Length : 750mm
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.