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QSS 090 (OTTO) Quartz substrate, thickness 1.0 mm, size 15 × 15 mm - applications in semiconductor and optical device fabrication.
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Certificate Of Analysis
(For eg. B 1615-0108)
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Potassium Bromide Window, (42mm Dia. x 2mm Thick)
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Silicon wafer (single side polished), <100>, N (Phosphorous doped), diam. x thickness 50.8 mm x 280 μm
Cerium doped YAG (Ce:YAG) single crystal, Dimensions 75 mm x 50 mm, thick 0.5 mm
Silicon wafer, <100>, P-type, contains boron as dopant, diam. × thickness 2 in x 250 μm
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.