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Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
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Beam Expander (Magnification 3.0X )
7440-21-3
Silicon wafer (double side polished), <100>, Intrinsic, dia x thickness 150 mm x 625 µm
Barium fluoride window diam. x thick 32 mm x 3 mm
Silicon wafer (single side polished), <111>, N-type, contains phosphorus as dopant, diam. x thickness 2 in. x 0.275 mm
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.