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Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
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Cadmium zinc telluride wafers 25mm x 25mm thick 1.2 mm
Calcium fluoride substrates, 25 mm x 15 mm x 1.5 mm
Silicon wafers, P-type, dia 4 inch, thick 0.525 mm [Thermal oxide wafer 100 nm SiO2 layer on Si (100)]
Dielectric coated beam splitter (Multi-layer) 1050-1070 nm
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.